Correlation study between ESD test models


© Fraunhofer EMFT
cc-TLP-electrode above wafer

In September 2016, the Analysis & Test group received a grant worth $ 30,000 from the 2016 Educational Research Council of the American ESD Association Inc. promoting outstandingindustry-related research in the area of electrostatic discharge. The award specifically supports a doctoral thesis looking into the correlation between the Capacitively Transmission Line Pulsing method (CC-TLP) developed at Fraunhofer EMFT and the Charged Device Model Test CDM, which involves a significant degree of measurement uncertainty. Cutting-edge integrated circuits with Gbit/s data rates are being tested.


The sponsors are Cisco Corp, GlobalFoundries Corp. and the ESD Association.