ESD characterization of remote keys

Description

© Fraunhofer EMFT
ESD System test with wide band measurement of the secondary discharge current

The automated production of chipcard inlays on carrier foil is subject to a high risk of damage due to electrostatic discharge: this is because dual-band RFIDs (remote keys) with two antennas can form unconventional discharge paths. In collaboration with an industry partner, researchers at Fraunhofer EMFT investigated and modeled this type of discharge in inlays, replicating it by means of the appropriate stress methods such as CDM and VF-TLP. The aim was to achieve a better understanding of discharge characteristics. The results help enhance the robustness of the integrated circuit.