Microelectronic devices and systems are getting smaller and more complex – this also presents ESD protection with new challenges. Many established test methods are reaching their limitations. Researchers at Fraunhofer EMFT have developed new solutions that provide more accurate and reproducible measurement results.
We have all experienced it: you touch a doorknob and suddenly get a shock because you just walked across a carpet. This is the fault of electrostatic discharges (ESD), which result from an imbalance in positive and negative charge between two objects. Around 3000 V are required before a human can feel a discharge of this type. Semiconductor modules are not quite as sturdy: as little as 30 V can result in damage or functional impairment to such devices. Often, only certain parameters are shifted, which can lead to higher power consumption, for example. This can, however, reduce the service life of a battery, rechargeable or otherwise.