RF Chip Characterization at Fraunhofer EMFT

Test environment for RF chip characterization
© Fraunhofer EMFT / Bernd Müller
Test environment for RF chip characterization

With our state-of-the-art equipment for RF chip characterization, sponsored by Forschungsfabrik Mikroelektronik Deutschland (FMD), we offer a broad selection of RF measurements to characterize the next generation high-frequency chips.  

Large Signal Measurements

  • Continuous-wave (CW) characterization of chips operating at mm-wave frequencies used in RADAR and 5G communication front-end modules.
  • Signal generator (SG) capable of synthesizing spectrally clean CW signals up to 67 GHz.
  • Spectrum Analyser (SA) with a very wide native bandwidth up to 85 GHz.
  • Multiband frequency extenders for signal generation up to 170 GHz.


State-of-the-art 4-port Keysight PNA-X VNA for differential S-parameter measurements up to 67 GHz.

Phase Noise

Phase Noise measurement capabilities without frequency extenders/mixers for carriers up to 85 GHz.

Time Domain Measurements

4 GHz wideband time domain measurements using R&S RTO2000 oscilloscope.

These technologies for RF chip characterization are available at Fraunhofer EMFT for your application topics. We look forward to hearing from you!

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