Fraunhofer Institute for Electronic Microsystems and Solid State Technologies EMFT
Fraunhofer Institute for Electronic Microsystems and Solid State Technologies EMFT

RF Chip Characterization at Fraunhofer EMFT

Test environment for RF chip characterization
© Fraunhofer EMFT / Bernd Müller
Test environment for RF chip characterization

With our state-of-the-art equipment for RF chip characterization, sponsored by Forschungsfabrik Mikroelektronik Deutschland (FMD), we offer a broad selection of RF measurements to characterize the next generation high-frequency chips.  

Large Signal Measurements
  • Continuous-wave (CW) characterization of chips operating at mm-wave frequencies used in RADAR and 5G communication front-end modules.
  • Signal generator (SG) capable of synthesizing spectrally clean CW signals up to 67 GHz.
  • Spectrum Analyser (SA) with a very wide native bandwidth up to 85 GHz.
  • Multiband frequency extenders for signal generation up to 170 GHz.

S-Parameters

State-of-the-art 4-port Keysight PNA-X VNA for differential S-parameter measurements up to 67 GHz.

Phase Noise

Phase Noise measurement capabilities without frequency extenders/mixers for carriers up to 85 GHz.

Time Domain Measurements

4 GHz wideband time domain measurements using R&S RTO2000 oscilloscope.

These technologies for RF chip characterization are available at Fraunhofer EMFT for your application topics. We look forward to hearing from you!

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© Fraunhofer EMFT / Bernd Müller

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