![Test environment for RF chip characterization Test environment for RF chip characterization](/en/technologies-microelectronics-microsystem-technology/chip-design-prototyping-lab/jcr:content/contentPar/sectioncomponent/sectionParsys/wideimage_copy_copy_/imageComponent/image.img.jpg/1637774756879/test-environment-rf-chip-characterization-fraunhofer-emft-broad.jpg)
Test environment for RF chip characterization
With our state-of-the-art equipment for RF chip characterization, sponsored by Forschungsfabrik Mikroelektronik Deutschland (FMD), we offer a broad selection of RF measurements to characterize the next generation high-frequency chips.
Large Signal Measurements |
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S-Parameters |
State-of-the-art 4-port Keysight PNA-X VNA for differential S-parameter measurements up to 67 GHz. |
Phase Noise |
Phase Noise measurement capabilities without frequency extenders/mixers for carriers up to 85 GHz. |
Time Domain Measurements |
4 GHz wideband time domain measurements using R&S RTO2000 oscilloscope. |