Fraunhofer Institute for Electronic Microsystems and Solid State Technologies EMFT
2-pin test system in the Fraunhofer EMFT test lab for electronic components and systems
Labs for Test and Analysis of Electronic Components and Systems at Fraunhofer EMFT
Test Lab for Electronic Components and Systems
| Half-automatic wafer prober upto 300 mm with thermochuck | |
| Semiconductor parameter analyzers | |
| Network analyzers in Megahertz domain upto 110 Gigahertz and simulator Agilent ADS | |
| Generation and measurement of high current pulses in Piko- and Nanosecond domain | |
| 62 Gigahertz real time oscilloscope | |
| Electrostatic Discharge characterization and load (automatic 2-pin tester, CDM, HBM, TLP, VF-TLP, CC-TLP) | |
| Robustness measurement station for EOS/ESD | |
| Continuous bending tester for flexible and rigi-flexible setups | |
| High resolution x-ray tomography and laminography for components and circuit boards | |
| High resolution scanning electron microscope with EDX-analysis |
Analysis Lab for Electronic Modules and Components
ESA - Accepted Qualification Lab
- Qualification inspections and reliability tests of circuit boards, electronic modules and tools according to Norm1
- Failure analysis and metallographic preparation with optical microscopes and x-ray inspection as well as REM/EDX
- Risk analysis and process optimization as well as development of test methods and devices
| Climatic chamber for humidity and heat | Climatic testing: humidity-heat cyclic upto +95°C and 98 % r.H. |
| Climatic chamber with 2 testing chambers | |
| Climatic chamber for temperature changes | Climatic testing: temperature changes upto 200°C and 10k/min Climatic testing: rapic temperatur changes between -80°C and 220°C |
| Drying chamber | |
| Push-pull material testing equipment with climatic chamber and video recording | Schock testing upto 5,9 max. vector power and 4000 Hz Combined temperature- and vibration testing |
| Electrodynamic swing arm with triaxial clamping device | Vibration tesing: sinusoidal, wideband upto 2,93 max. vector power and 4000 Hz |
| Stereo- and direct light microscopes with bild analysis | |
| Confocal 3D laser scanning microscope | |
| High ressolution scanning electron microscope with EDX-Analysis | |
| X-ray inspection device with high performance CT Scan | High resolution X-ray analysis with CT- testing |
| High resolution DC voltage and power source with high sampling rate | Electrical life cycle testing with automatic voltage and resistance measurement |
| Teraohm- and Picoamperemeter | |
| Programmable high current lab power supply upto 1000 A | |
| Contamination measurement device | |
| Soldering bath with SPS control |