Test and Analysis

Fraunhofer EMFT has wide-ranging expertise and professional infrastructure for test and analysis of electric components and systems. The R&D activities include failure analyses, ESD test and protection concepts, component preparation for safety analyses as well as test and characterization of semiconductor components. Additionally, Fraunhofer EMFT has a CC-EAL6 certified secure in-house laboratory.

 

Systematic analysis for IP and compliance

With miniaturization in microelectronics, demands on components increase - posing a particular challenge for SMEs. Fraunhofer EMFT offers comprehensive services in failure analysis, quality assurance, reliability assessment, and process consulting - from system to chip level.

 

Electrostatic Discharge - ESD

Fraunhofer EMFT is a leader in the research and application of electrostatic discharge (ESD) in microelectronics. With specialized testing methods, custom test equipment, and robust protection concepts, it offers internationally recognized solutions—practical and integrable into development and quality assurance processes.

 

Cryogenic tests of semiconductor components

Fraunhofer EMFT in Munich bridges research and industry by characterizing electronic semiconductor devices such as transistors and memory chips under cryogenic conditions. This enables the evaluation of performance and reliability at extreme temperatures - forming the foundation for innovative technologies.

 

Cryogenics: Characterization of Quantum Hardware Components

Precise measurement methods are crucial for developing superconducting quantum computers to improve the quality, stability, and performance of components such as qubits and signal lines. Fraunhofer EMFT possesses the expertise and equipment to conduct analyses in measurement environments of just a few millikelvin.

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